CHUCHVAGA, N.; А.V. А.; Titov А.; TOKMOLDIN, N.; TOKMOLDIN, S.; Terukov Е. INVESTIGATION OF PASSIVATION OF SURFACE STATES OF SINGLE CRYSTALLINE SILICON IN HETEROSTRUCTURES WITH AN INTEGRATED THIN AMORPHOUS LAYER. Известия НАН РК. Серия физико-математическая, [S. l.], n. 5, p. 95–101, 2020. Disponível em: http://89.250.84.46/physics-mathematics/article/view/627. Acesso em: 23 дек. 2024.